Utilize our interferometer systems with measurement apertures from 4 to 12 inches for your metrology needs. We provide a complete measuring station, including an isolated measuring table. Depending on the application, we also offer various upgrade levels.
4″ Interferometer
| System: | Laser based Fizeau-interferometry |
| Lens: | Exchangeable spherical references Bayonet lock |
| Standard series: | 0,75 / 1,0 / 1,5 / 3,3 / 7,2 |
| System quality: | / 10 |
| CNC-axis: | X-Y-levelling |
| CNC-axis: | Z- coarse / fine adjustment |
| Resolution: | 768 x 576 Pixel |
| Z-travel: | 500 mm |
| Dimensions: | 950 x 330 x 400 |
| Weight: | ca. 40 kg |
| Typ: | Helium-Neon class II |
| Wavelength: | 632,8 nm |
| Output power: | 1,5 mW |
Automatic fringe analysis
• Piezo phase- shift unit
• Software based on Windows 7
High-resulution Camera
Z- scale for precision radius measurement
Reference flat
Interferometer
– Fizeau Interferometer
– 4″ -System
– Tabletop system
– Automatic interference evaluation
6″ Interferometer
– Fizeau Interferometer
– Measurement aperture 6″
– Granit base
– Passive vibration isolation system
– Automatic interference evaluation
| System: | Laser based, Fizeau-interferometry Measurment of flatness characteristics of superfinished, highly reflective surfaces and optics (with additional components lapped surfaces as well) |
| System quality: | / 10 |
| Sample feeding: | horizontal (option: vertical) |
| Resolution: | 768 x 576 Pixel |
| Dimensions: | 800 mm x 800 mm x 2000 mm |
| Typ: | Helium-Neon class II |
| Wavelength: | 632,8 nm |
| Output power: | 1,5 mW |
| Beam polarization: | circular |
Automatic fringe analysis
• Piezo phase- shift unit
• Software based on Windows 7
Zoom
High-resulution Camera
Interferometer
12″ Interferometer
| System: | Laser based, contactless, 3D optical phase-shifting interferometry Measurment of flatness characteristics of superfinished, highly reflective surfaces and optics (with additional components lapped surfaces as well) |
| Sample feeding: | horizontal (option: vertical) |
| System quality: | / 8 |
| Resolution Camera | 768 x 576 Pixel, (option: higher resolution) |
| Typ: | Helium-Neon class II |
| Wavelength: | 632,8 nm |
| Output power: | 1,5 mW |
| Beam polarization: | circular |
- Livebild am Monitor
- Software für Windows 7
- Automatische Generierung von Protokollen
- 2D und 3D Graphik
- Unterschiedliche Messdarstellungen
- Kalibrierung manuell/automatisch
- Zoom
- System quality: . ./10
- High resolution Camera
Interferometer
– Fizeau Interferometer
– Measuring diameters from 4″ to 12″
– Granit base
- Passive vibration isolation system
– Automatic interference evaluation
Contact person
| First name: | Richard |
| Last name: | Widemann |
| Responsible for: | UP-technology, service |
| Phone: | +49 (0) 7552 – 4 05 99-80 |