Nutzen Sie unsere Interferometersysteme mit Messaperturen von 4“ bis 12“ für Ihre Metrologie. Hierbei liefern wir Ihnen einen vollständigen Messplatz inklusive isoliertem Messtisch. Je nach Anwendung bieten wir Ihnen auch verschiedene Ausbaustufen an.
4″ Interferometer
| System: | Laser based Fizeau-interferometry |
| Lens: | Exchangeable spherical references Bayonet lock |
| Standard series: | 0,75 / 1,0 / 1,5 / 3,3 / 7,2 |
| System quality: | / 10 |
| CNC-axis: | X-Y-levelling |
| CNC-axis: | Z- coarse / fine adjustment |
| Resolution: | 768 x 576 Pixel |
| Z-travel: | 500 mm |
| Dimensions: | 950 x 330 x 400 |
| Weight: | ca. 40 kg |
| Typ: | Helium-Neon class II |
| Wavelength: | 632,8 nm |
| Output power: | 1,5 mW |
Automatic fringe analysis
• Piezo phase- shift unit
• Software based on Windows 7
High-resulution Camera
Z- scale for precision radius measurement
Reference flat
4″ Interferometer
– Fizeau Interferometer
– 4″ -System
– Tabletop system
– Automatic interference evaluation
6″ Interferometer
– Fizeau Interferometer
– Measurement aperture 6″
– Granit base
– Passive vibration isolation system
– Automatic interference evaluation
| System: | Laser based, Fizeau-interferometry Measurment of flatness characteristics of superfinished, highly reflective surfaces and optics (with additional components lapped surfaces as well) |
| System quality: | / 10 |
| Sample feeding: | horizontal (option: vertical) |
| Resolution: | 768 x 576 Pixel |
| Dimensions: | 800 mm x 800 mm x 2000 mm |
| Typ: | Helium-Neon class II |
| Wavelength: | 632,8 nm |
| Output power: | 1,5 mW |
| Beam polarization: | circular |
Automatic fringe analysis
• Piezo phase- shift unit
• Software based on Windows 7
Zoom
High-resulution Camera
6″ Interferometer
12″ Interferometer
| System: | Laser based, contactless, 3D optical phase-shifting interferometry Measurment of flatness characteristics of superfinished, highly reflective surfaces and optics (with additional components lapped surfaces as well) |
| Sample feeding: | horizontal (option: vertical) |
| System quality: | / 8 |
| Resolution Camera | 768 x 576 Pixel, (option: higher resolution) |
| Typ: | Helium-Neon class II |
| Wavelength: | 632,8 nm |
| Output power: | 1,5 mW |
| Beam polarization: | circular |
- Livebild am Monitor
- Software für Windows 7
- Automatische Generierung von Protokollen
- 2D und 3D Graphik
- Unterschiedliche Messdarstellungen
- Kalibrierung manuell/automatisch
- Zoom
- System quality: . ./10
- High resolution Camera
12″ Interferometer
– Fizeau Interferometer
– Measuring diameters from 4″ to 12″
– Granit base
- Passive vibration isolation system
– Automatic interference evaluation
Contact person
| First name: | Richard |
| Last name: | Widemann |
| Responsible for: | UP-technology, service |
| Phone: | +49 (0) 7552 – 4 05 99-80 |