Stand alone device

Nutzen Sie unsere Interferometersysteme mit Messaperturen von 4“ bis 12“ für Ihre Metrologie. Hierbei liefern wir Ihnen einen vollständigen Messplatz inklusive isoliertem Messtisch. Je nach Anwendung bieten wir Ihnen auch verschiedene Ausbaustufen an.

4″ Interferometer

4" Interferometer
4
Specifications
Laser specification
Options
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Specifications
System: Laser based Fizeau-interferometry
Lens: Exchangeable spherical references
Bayonet lock
Standard series: 0,75 / 1,0 / 1,5 / 3,3 / 7,2
System quality: / 10
CNC-axis: X-Y-levelling
CNC-axis: Z- coarse / fine adjustment
Resolution: 768 x 576 Pixel
Z-travel: 500 mm
Dimensions: 950 x 330 x 400
Weight: ca. 40 kg
Laser specification
Typ: Helium-Neon  class II
Wavelength: 632,8 nm
Output power: 1,5 mW
Options

Automatic fringe analysis
• Piezo phase- shift unit
• Software based on Windows 7
High-resulution Camera
Z- scale for precision radius measurement
Reference flat

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4″ Interferometer

– Fizeau Interferometer
– 4″ -System
– Tabletop system
– Automatic interference evaluation

6″ Interferometer

– Fizeau Interferometer
– Measurement aperture 6″
– Granit base
– Passive vibration isolation system
– Automatic interference evaluation

6" Interferometer
6
Specifications
Laser specification
Options
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Specifications
System: Laser based, Fizeau-interferometry
Measurment of flatness characteristics of
superfinished, highly reflective surfaces and
optics (with additional components lapped
surfaces as well)
System quality: / 10
Sample feeding: horizontal (option: vertical)
Resolution: 768 x 576 Pixel
Dimensions: 800 mm x 800 mm x 2000 mm
Laser specification
Typ: Helium-Neon class II
Wavelength: 632,8 nm
Output power: 1,5 mW
Beam polarization: circular
Options

Automatic fringe analysis
• Piezo phase- shift unit
• Software based on Windows 7
Zoom
High-resulution Camera

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6″ Interferometer

12″ Interferometer

Specifications
Laser Spezifikation
Software
Options
Download flyer
Specifications
System: Laser based, contactless, 3D optical
phase-shifting interferometry
Measurment of flatness characteristics of
superfinished, highly reflective surfaces and
optics (with additional components lapped
surfaces as well)
Sample feeding: horizontal (option: vertical)
System quality: / 8
Resolution Camera 768 x 576 Pixel,
(option: higher resolution)
Laser Spezifikation
Typ: Helium-Neon class II
Wavelength: 632,8 nm
Output power: 1,5 mW
Beam polarization: circular
Software
  • Livebild am Monitor
  • Software für Windows 7
  • Automatische Generierung von Protokollen
  • 2D und 3D Graphik
  • Unterschiedliche Messdarstellungen
  • Kalibrierung manuell/automatisch
Options
  • Zoom
  • System quality: . ./10
  • High resolution Camera
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12″ Interferometer

– Fizeau Interferometer
– Measuring diameters from 4″ to 12″
– Granit base
- Passive vibration isolation system
– Automatic interference evaluation

Contact person

Joachim Arnold
First name: Joachim
Last name: Arnold
Responsible for: Technology metal optics and tools
Phone: +49 (0) 7552 – 4 05 99-60
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